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Capability

time-of-flight secondary ion mass spectrometry (TOF-SIMS)

Suppliers
1
States & provinces
1
Countries
1

1 time-of-flight secondary ion mass spectrometry (tof-sims) supplier across 1 states and provinces in 1 country. Profiles show capabilities, materials, certifications, and facility locations so you can compare shops and build a shortlist.

Suppliers

ION-TOF USA INC

SPRING VALLEY, NY

IONTOF USA is the US-based subsidiary of IONTOF, a German manufacturer of instruments for surface analysis with product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS). IONTOF was founded in 1989 as a spin-off of the University of Münster. IONTOF USA was founded in 2000 to represent IONTOF and its product lines in the United States and provide support to TOF-SIMS and LEIS customers, operating a full service network with trained service engineers across the United States.

3D analysisdepth profilingin situ SPMion beam technologylow energy ion scattering (LEIS)MS/MSretrospective analysissurface analysissurface imaging

Compiled from public sources

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