1 in situ spm supplier across 1 states and provinces in 1 country. Profiles show capabilities, materials, certifications, and facility locations so you can compare shops and build a shortlist.
IONTOF USA is the US-based subsidiary of IONTOF, a German manufacturer of instruments for surface analysis with product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS). IONTOF was founded in 1989 as a spin-off of the University of Münster. IONTOF USA was founded in 2000 to represent IONTOF and its product lines in the United States and provide support to TOF-SIMS and LEIS customers, operating a full service network with trained service engineers across the United States.
3D analysisdepth profilingion beam technologylow energy ion scattering (LEIS)MS/MSretrospective analysissurface analysissurface imagingtime-of-flight secondary ion mass spectrometry (TOF-SIMS)
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