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Capability

spectroscopic ellipsometry

Suppliers
2
States & provinces
2
Countries
1

2 spectroscopic ellipsometry suppliers across 2 states and provinces in 1 country. Profiles show capabilities, materials, certifications, and facility locations so you can compare shops and build a shortlist.

Suppliers

ANGSTROM SUN TECHNOLOGIES INC

ACTON, MA

Angstrom Sun Technologies Inc., headquartered in Boston, USA, is a privately held company specializing in affordable optical solutions. It provides cost-effective tools for characterizing thin film thickness, thick coating thickness, wafer thickness, gap thickness, optical properties (refractive index N and extinction coefficient K), surface and interface behavior, and alloy concentrations. It also offers advanced analytical services for thin films, thick coatings, complex layer stacks, wafer thickness, TTV, and gap thickness, plus vision products with U

Analytical and development services for thin filmsAutomation with wafer mappingFilm thickness mappingIn-line and in-situ metrologyMicrospectrophotometrySpectroscopic reflectometrythin film characterizationWafer thickness measurement

Compiled from public sources

J. A. WOOLLAM CO., INC.

LINCOLN, NE

J.A. Woollam designs and manufactures spectroscopic ellipsometers for thin film characterization, including the M-2000, RC2, iSE, theta-SE, alpha 2.0, VASE, IR-VASE, and VUV-VASE systems, along with WVASE and CompleteEASE software. The company is headquartered in Lincoln, Nebraska, and serves applications in optical coatings, chemistry/biology, semiconductors, photovoltaics, and in-situ process monitoring.

automated mappinggeneralized ellipsometryin-situ monitoring and process controlMueller-matrix measurementthin film characterization

Compiled from public sources

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