Spatially Resolved Dynamic Light Scattering (SR-DLS)

InProcess-LSP develops nanoparticle size analyzers for real-time, inline monitoring and non-destructive measurement in closed containers under process-relevant conditions. Its systems are built on patented Spatially Resolved Dynamic Light Scattering (SR-DLS) technology and support development, process optimization, and manufacturing workflows, including GMP-aligned environments.

Read more

GMP-compliant and OPC-UA-compatible softwarehigh turbidity measurement without dilutionlarge particle detectionnon-destructive measurement in closed containersreal-time inline particle size monitoring