inline/insitu metrology

Angstrom Research Inc. provides a broad range of technology, marketing and investment consulting in the nanotechnology and semiconductor fields. It specializes in recognizing and advancing technologies by leading research teams to tackle difficult problems using novel team structures and solution paths, and has extensive experience developing and implementing IP strategies. Its mission is to solve difficult R&D issues in the nanotech and semiconductor space using problem solving techniques, design of experiments and team building.

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Atomic Force Microscopy (AFM)atomic layer deposition (ALD)CD-SEM design and applicationCharged Particle detectiondesign of experimentsFocused Ion Beam (FIB) for advanced Circuit Editfunctional thin film design, development and processingoptical metrology (overlay, scatterometry) design and applicationphotolithographic metrologysingle-photon detectionteam building